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Grain boundary diffusion of Cr in a near Ni S11(113)[110] bicrystal is measured over a temperature interval between 503 K and 1203 K using the radiotracer technique. The grain boundary diffusion coefficients, Dgb, and the triple products, P = s*d*Dgb, are determined in the C- and B-type kinetics regimes, respectively, with s being the segregation factor and d the grain boundary width. Opposite to expectations, two distinct contributions to short-circuit diffusion along the nominally single interface are distinguished and related to the existence of two macroscopic facets with distinct grain boundary inclinations and, as a result, distinct structures. The experimental results indicate that the segregation factor of Cr in Ni is about unity, which is fully supported by ab initio calculations. Using classical atomistic simulations, Ni grain boundary self-diffusion coefficients are calculated for the symmetric and asymmetric facets. The computational simulations reveal accelerated self-diffusion kinetics along the asymmetric facet, attributing this phenomenon to the presence of disconnection-like defects. This elucidates the experimentally observed diffusion dynamics of chromium atoms, thereby corroborating the heterogeneous mechanisms governing atomic migration across distinct facets.